Running the Smart Card Reader Surprise Removal Test (Windows Embedded CE 6.0)

  • Article

1/6/2010

Applies to Windows Embedded CE 6.0 R2

The Smart Card Reader Surprise Removal Test tests whether the unexpected removal of the smart card reader results in the appropriate smart card reader sub–system state. To run this test using the default values, at the command line, type tux -o -d ifdtesttux -x 2001

Note

If the system being tested has a display, the instructions, progress, and test results will be shown on the system display. However, if the system does not have a display screen, the instructions, progress, and test results will be displayed in the Windows Embedded CE 6.0 R2 (and later versions) Output window.

Procedure

The following procedure describes the functionality of the Smart Card Reader Surprise Removal Test

  1. The test operator detaches the smart card reader from the system.

  2. The test operator attaches the smart card reader to the system.

  3. The test opens a handle to the reader and runs AutoIFD, the one–card version of the Smart Card Protocol Tests described in the Smart Card Reader Test (IFDTest2) topic.

  4. During the AutoIFD test, the test operator detaches the card reader at any point.

  5. The test closes the smart card reader handle.

  6. The test operator attaches a smart card reader to the system.

  7. The test opens a handle to the reader and runs AutoIFD, the one-card version of the Smart Card Protocol Tests described in the Smart Card Reader Test (IFDTest2) topic.

  8. The test closes the handle to the smart card reader.

The number of iterations of the full test can be configured by using the -c "-n iterations" command-line parameter. Steps one and two can be configured to repeat within each full test iteration by using the -c "-p iterations" command–line parameter. The following example shows how you can use command–line parameters to configure the test to iterate two times.

tux -o -d ifdtesttux -x 2001 -c"-n 2"

See Also

Concepts

Smart Card Reader Surprise Removal Test
Smart Card Reader Test (IFDTest2)