OAL Cache Churn Test (Windows Embedded CE 6.0)
1/6/2010
This test causes churn of the memory hierarchy and cache systems by mixing operations, such as allocation, freedom, reading, and writing, on blocks of memory.
To cause the churn, the test uses heuristic algorithms to perform the following tasks:
- Randomly move data into and out of the cache.
- Continuously put pressure on the cache.
- Test whether the VirtualAlloc(…) API returns zero-filled data. If it does not, this is good evidence of cache problems, because programs depend upon this behavior.
- Test whether data written to the cache matches that read from the cache.
In This Section
- Prerequisites of the OAL Cache Churn Test
Specifies the hardware and software requirements for this test
- Test Cases for the OAL Cache Churn Test
Describes the test cases for this test
- Command-Line Parameters for the OAL Cache Churn Test
Describes the command-line parameters for this test
- Running the OAL Cache Churn Test
Describes how to run this test
- Troubleshooting the OAL Cache Churn Test
Provides troubleshooting information for this test