Running the Multiple Smart Card Reader Test (Windows Embedded CE 6.0)
1/6/2010
Applies to Windows Embedded CE 6.0 R2
The Multiple Smart Card Reader Test verifies that when more than one smart card reader is attached to a device, all attached smart card readers can be used.
Note
If the system being tested has a display, the instructions, progress, and test results will be shown on the system display. However, if the system does not have a display screen, the instructions, progress, and test results will be displayed in the Windows Embedded CE 6.0 R2 (and later versions) Output window.
Procedure
To run the Multiple Smart Card Reader Test
Attach several smart card readers to the system.
Insert one of the PC/SC test cards of the IFDTest2 suite into each card reader.
At the command-line, type tux -o -d ifdtesttux -x 3000.
For each attached smart card reader, the test opens a handle to the reader and runs AutoIFD, the one–card version of the Smart Card Protocol Tests described in the Smart Card Reader Test (IFDTest2) topic. The test then closes the reader handle.