Test Cases for the Smart Card Reader Test (IFDTest2) (Windows Embedded CE 6.0)

  • Article

1/6/2010

Applies to Windows Embedded CE 6.0 R2

The following table describes the test cases for the Smart Card Reader Test (IFDTest2).

Test Case ID Description

1000

Part A: Card Monitor Test

Checks for proper detection of the smart card insertion state, and for the proper handling of operations interrupted by the unexpected removal of a card.

Verifies whether IOCTL_SMARTCARD_IS_PRESENT and IOCTL_SMARTCARD_IS_ABSENT produce valid results.

1001

Part B: Card Reader Interface Test

Checks for proper handling of property and state information in the smart card reader driver.

1002

Part C: Resource Manager Simulation Test

Verifies successful completion of state-change operations normally initiated by the Smart Card Resource Manager.

1003

Part D: Card Protocol Test

Verifies compatibility with a representative set of commonly-available smart cards, as well as with cards that exhibit certain specifically-programmed behavior. For more information about these behaviors, see Running the Smart Card Reader Test (IFDTest2). The following list shows all of the cards required for this test.

  • Infineon Technologies PC/SC Compliance Test Card (Card 0 / Unlabeled)
  • Athena T0 Test Card (Card 1)
  • Athena T0 Inverse Convention Test Card (Card 2)
  • Axalto 32K eGate Test Card (Card 3)
  • Infineon SiCrypt Card Module Test Card (Card 4)

1004

Part E: Power Management Test

Verifies that the smart card reader driver returns the correct state information for the card reader across suspend/resume sequences.

See Also

Concepts

Smart Card Reader Test (IFDTest2)